OPI-175 EL TEST SYSTEM

Equipment to measure electrical and optical properties of LED epi wafer at the same time.

• Measure EL property of LED epi
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• ㆍMeasure electroluminescence of LED epi wafer.

• ㆍ Measure upper/lower illumination of wafer by using glass.

• ㆍHas measuring sensors in upper and lower parts.

• ㆍEasy to move and contact to wafer toward xyz axis by using knob.

• ㆍMaximize work convenience and productivity.

• ㆍAccurate light receiving by using 2" integrating sphere for light head.

• ㆍImprove measurement accuracy by using optical power meter andspectrometer at the same time.

• ㆍhighly user friendly SW environment.

• Integrated measurement of optical and electrical properties
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• ㆍoptical properties measurement items.

• - Spectral properties: Peak wavelength, dominant wavelength, mid-wavelength, center wavelength, Full width half max, color coordinate, purity, color temperature, Color rendering index , etc.

• - Amount of light: luminous intensity, intensity radiation , etc.

• ㆍElectrical property measurement items- forward current, forward voltage, reverse current, reverse voltage, etc.

• ㆍSweep measurement items.

• - current-voltage, voltage-current, current-optical properties.

• ㆍMeasure Spectral properties using High sensitivity and resolution spectrometer.

• ㆍEnsure accurate and stable measurement of optical power via real time color correction of PD using integrating sphere type input optical system andspectrometer.

• ㆍMeasure electrical property using high speed and precision source meter.

• ㆍMeasure up to 1A of current stressing.

• Optimized for QA and R&D
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• ㆍMeasure current-voltage, voltage-current, current-optical Sweep.

• ㆍSelect various Fourier domains. (UV, UV-VIS, VIS, VIS-IR)

• ㆍSelect various power sources (voltage and current) stressing and measurement ranges by using Keithley2400 Sourcemeter.

• ㆍAdditional features available as per user requirements. (Optional)

• Highly friendly user environment
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• ㆍIntuitive recognition of measurement results- measurementspectrum, color coordinate, cumulatedspectrum,

• ㆍDisplay results in list format or graph by measuring items, and mapping.

• ㆍSetting up various conditions - User selected optical and electrical property items, and sweep measurement settings.

• ㆍGrade setting function.

• ㆍSave individual measurement value from upper and lower sensors and Total value.

• ㆍSave data of temperature change over time. (Data and image file)

• ㆍSave and open measurement conditions in a form of Project file.

• Accurate and stable measurement
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• ㆍProvide CIE and KS standard measurement mode.

• ㆍCorrect using Korea Research Institute of Standards and Science certified lamp and LED.

• ㆍProxy Korea Research Institute of Standards and Science(KRISS) correction certification. (Optional)

• Technical support and maintenance
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• ㆍUser oriented set-up and instruction.

• ㆍDevelop SW to meet user requirements.

• ㆍProvide measurement knowledge and information through activities in CEI and photometry club.

• ㆍRapid A/S: Support jig for measurement of various types of sample.

• Voltage Range	±1㎶ ~ ±205V
  Current Range	±100pA to ±1.0A
  Probe Station	150mm Glass Plate X-Y Movement : 50 X 50mm Travel
  PD Temperature	20℃ to 30℃ 중 선택, 고정
  Spectrometer	350 to 830nm, 2048 CCD array type
  Optical Head	50mm Integrating Sphere
  Photodiode	380 to 950nm, 10㎟ Area




 
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