M2N Scanning Probes are designed and fabricated for high resolution AFM measurement. The atomic force microscope(AFM) probes the surfaces of a sample with a sharp tip. The apex of the probe tip is typically less than 10nm. Tip has a tetrahedral shape and is located at the very end of the cantilever. that is 100 to 200um long. Forces between the tip and the sample surface cause the cantilever deflection as the tip is scanned over the sample, or the sample is scanned under the tip
Features
Typical tip radius better than 10nm
High mechanical Q-factor for high sensitivity
Applications
AFM Probing System
Specifications
Parameter
Tap Mode
Multi Mode
Contact Mode
Length
125um ± 10um
225um ± 2.5 um
450um ± 2.5um
Width
35um ± 5um
Thickness
4um ± 1um
Resonant Frequency
300kHz ± 100kHz
75kHz ± 25kHz
20kHz ± 7kHz
Spring Constant
40 N/m
3 N/m
0.9 N/m
Quality Factor
300(typical)
Tip Radius
<15nm, 10nm typical
Tip Height
15 um ± 2.5 um
All data are typical values calculated with FEM method. All data are subject to change without further notice.
Silicon Probes for AFM (Atomic Force Micro...
Description
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- Payment: We accept payment through Paypal Only.
- Shipping: We will ship the catalog once the payment is received. And you will be receiving the catalog with in 10 -14 busines days. Shipping might be delayed in due to international shipping conditions which is depends on the countries receiveing. In case hard copy of catalog is not available then we will ship the soft copy.
- Refund: We can refund the order before shipping process was initiated. Incase Catalog not available, we will make sure to refund the order.
- Note: This is a Catalog Produt.
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