M2N Scanning Probes are designed and fabricated for high resolution AFM measurement. The atomic force microscope(AFM) probes the surfaces of a sample with a sharp tip. The apex of the probe tip is typically less than 10nm. Tip has a tetrahedral shape and is located at the very end of the cantilever. that is 100 to 200um long. Forces between the tip and the sample surface cause the cantilever deflection as the tip is scanned over the sample, or the sample is scanned under the tip
Features
Typical tip radius better than 10nm
High mechanical Q-factor for high sensitivity...