The motorized stage is a precision control unit to control the motion of the table of the product by using motors and screws. As it is a small automatic precision stage, it can be used for the manufacturing processes of precision measuring units, semiconductors and FPD, in which a short-range working space ranging 0.001~20mm, precision, and

The motorized stage is a precision control unit to control the motion of the table of the product by using motors and screws. As it is a small automatic precision stage, it can be used for the manufacturing processes of precision measuring units, semiconductors and FPD, in which a short-range working space ranging 0.001~20mm, precision, and

As the actuator is realized in a way that minimizes the outer space and maximizes the working space, the automatic stage is mainly used for the semiconductor/FPD manufacturing processes, in which the travelling distance is short and precision control is required. Features -The company has successfully developed a compact size actuator with

A goniometer stage is designed to rotate and tilt around on one point on a table. It is used for deciding the tilting angle for a load, such as a camera or a laser unit. Its angle can be controlled closely in the unit of 0.1 degree, so it is used for diverse purposes such as precision measuring, semiconductors and FPD manufacturing/inspection

The motorized stage is a precision control unit to control the motion of the table of the product by using motors and screws. As it is a small automatic precision stage, it can be used for the manufacturing processes of precision measuring units, semiconductors and FPD, in which a short-range working space ranging 0.001~20mm, precision, and

The manual stage makes it possible to control a position manually in the unit of 0.01mm by using the micrometer head. Used together with a camera or a laser unit, it is mainly for controlling their position. With its united guide that replaces the crossed roller guide, the stage shows a more robust and soft motion performance. Features -The

The equipment automatically and periodically measure property values constant temperature chamber without manual process by implementing constant temperature chamber and measuring instrument for evaluating reliability of high output LED unit and module.   Reliability test   ㆍDurability test: Measure properties of

Measure all performance items necessary for KS and certification. High performance and low cost equipment (Patent registration in progress)   floor plan Measuring

Measurement for base data of optical and electrical conversion efficacy to figure out which electrical signal detector such as solar cell outputs for radiance exitance or illumination by each wavelength.   Key features   ㆍMeasuring targets : Solar cell, silicon and optical diode ㆍChannel : 4ch auto

I-V CURVE meter dedicated to solar cell. Current measurement for various types of solar cell : Measure polarizations for 20A Measure Series resistance Rs, and parallel resistance Rsh Key features    ​          ㆍI-V CURVE meter dedicated to solar

Detect find crack of solar cell module-EL tester. Test efficacy among Cells/Strings of solar modules, Patented light source- Transferred technique from KRISS Measuring items   ㆍDetect find crack of solar cell module - EL tester - Imagery interpretation by infrared ray : 1sec / cell - Detect fine crack:

Calculate the highest percent flicker and flicker index by measuring average optical power of lamp   Technical Specifications * Photo diode : silicone photodiode, effective section area :100mm2, Mismatching factor : f1’<1.5% Class L * Equipment Sampling Rate : 5 kHz * Calculate Flicker Index and

Equipment to measure electrical and optical properties of LED epi wafer at the same time.   Measure EL property of LED epi   ㆍMeasure electroluminescence of LED epi wafer. ㆍ Measure upper/lower illumination of wafer by using glass. ㆍHas measuring sensors in upper and lower

It is program that automatically counts the number of chips with features; video processing speed : 10 sec/ 2inch wafer, input of model name, serial number, operator name, set up, save, open and modify condition for various chips.   Measurement via scanning   ㆍOptical resolution: 4,800dpi×9,600dpi (with

Easy to measure various items, User interface (Support on-demand SW design), integrated measurement of optical, electric

Measurement and data usability with consideration of user convenience in quality inspection, R&D, and reliability test.   Simultaneous measurement of optical properties/Electrical property   ㆍSimultaneous measurement of optical properties/Electrical property by one click. ㆍHigh sensitivity and

Measure optical/electrical/thermal properties for various high output, multi-chip, and module LED/OLED as well as current stressing and measurement. Support up to 3A and consecutive/pulse type   Measure performance of high output, multi chip LED/OLED   ㆍMeasure optical/electrical/thermal properties for various