MERLINAnalytical Power for the Sub-nanometer World As the flagship of the FE-SEM portfolio, the MERLIN® is a two-in-one system: it both meets even the highest demands on a high resolution imaging microscope and is also an optimized system for performing ultrafast analytical investigations with maximum beam current capabilities. On this basis,

The SIGMATM featuring GEMINI® technology, provides outstanding imaging and analytical results from a field emission scanning electron microscope with the capability to handle all material types. GEMINI® is established as the market leading field emission column design offering unrivaled ease of use, superb low voltage imaging and ultra stable

AURIGA®Information Beyond Resolution CrossBeam® workstations . the ultimate combination of FIB and GEMINI® column The AURIGA® is a highly flexible CrossBeam® workstation for custom tailored applications. Unique Imaging Imaging of non-conductive specimens using all standard detectors with local charge compensation Simultaneous

ULTRA SeriesUltra High Resolution FE-SEM for Nano-scale Compositional Analysis ULTRA PLUSNanoanalytical tool for high resolutionimaging and material analysis The ULTRA FE-SEM is the ultimate lab tool to meet the most demanding requirements from material science, life science and semiconductor applications. The ULTRA FE-SEM integrates the

EVO® HDHigh Performance, Total Flexibility The EVO® HD is the latest innovation in scanning electron microscopy from Carl Zeiss. Delivering a groundbreaking increase in resolution over conventional scanning electron microscopes (SEM), the EVO® HD introduces High Definition to electronmicroscopy. The EVO® HD features a new electron source

ORION® PLUSHelium Ion MicroscopeNext Generation Workstation for Nanoscale Research ORION® PLUSThe ORION® PLUS is the second generation helium ion microscope, providing superior surface- and high-resolution imaging even on challenging insulating materials and precision nanomodification capabilities. Helium Ion Microscopy complements existing

MERLINAnalytical Power for the Sub-nanometer World As the flagship of the FE-SEM portfolio, the MERLIN® is a two-in-one system: it both meets even the highest demands on a high resolution imaging microscope and is also an optimized system for performing ultrafast analytical investigations with maximum beam current capabilities. On this basis,

The SIGMATM featuring GEMINI® technology, provides outstanding imaging and analytical results from a field emission scanning electron microscope with the capability to handle all material types. GEMINI® is established as the market leading field emission column design offering unrivaled ease of use, superb low voltage imaging and ultra stable

AURIGA®Information Beyond Resolution CrossBeam® workstations . the ultimate combination of FIB and GEMINI® column The AURIGA® is a highly flexible CrossBeam® workstation for custom tailored applications. Unique Imaging Imaging of non-conductive specimens using all standard detectors with local charge compensation Simultaneous

ULTRA SeriesUltra High Resolution FE-SEM for Nano-scale Compositional Analysis ULTRA PLUSNanoanalytical tool for high resolutionimaging and material analysis The ULTRA FE-SEM is the ultimate lab tool to meet the most demanding requirements from material science, life science and semiconductor applications. The ULTRA FE-SEM integrates the

EVO® HDHigh Performance, Total Flexibility The EVO® HD is the latest innovation in scanning electron microscopy from Carl Zeiss. Delivering a groundbreaking increase in resolution over conventional scanning electron microscopes (SEM), the EVO® HD introduces High Definition to electronmicroscopy. The EVO® HD features a new electron source

ORION® PLUSHelium Ion MicroscopeNext Generation Workstation for Nanoscale Research ORION® PLUSThe ORION® PLUS is the second generation helium ion microscope, providing superior surface- and high-resolution imaging even on challenging insulating materials and precision nanomodification capabilities. Helium Ion Microscopy complements existing